Rietveld refinement of two-phase Zr-doped Y2O3

Materials Science Forum

Volumn 278-281, Issue PART 2, 1998, Pages 680-685

  Baldinozzi, G ^a   Berar J F ^b   Calvarin, G ^a  

^a ECOLE CENTRALE PARIS   (France)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

High Resolution Powder Diffraction; Quantitative Analysis; Rietveld Refinement

Indexed keywords

CRYSTAL STRUCTURE; DOPING (ADDITIVES); ELECTROMAGNETIC WAVE SCATTERING; NEUTRON SCATTERING; PHASE COMPOSITION; POWDERS; ZIRCONIUM; CHEMICAL ANALYSIS; DIFFRACTION; RELIABILITY ANALYSIS; X RAYS; ZIRCONIUM COMPOUNDS;

RIETVELD REFINEMENT; X RAY SCATTERING; YTTRIUM OXIDES;

YTTRIUM COMPOUNDS; RIETVELD REFINEMENT;

DIFFRACTION METHODS; HIGH RESOLUTION; HIGH RESOLUTION POWDER DIFFRACTIONS; POWDER SAMPLES; RELIABILITY FACTOR; SITE SELECTIVITY; STRUCTURAL MODELING; STRUCTURAL REFINEMENT;

EID: 0031634668     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

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