Long-term reliability evaluation of power semiconductor devices used in substation rectifiers

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1998, Pages 195-198

  Horiuchi, Toshikazu ^a   Sugawara, Yoshitaka ^a  

^a KANSAI ELECTRIC POWER CO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; LEAKAGE CURRENTS; POWER ELECTRONICS; RECTIFIER SUBSTATIONS; RELIABILITY; SPECTRUM ANALYSIS;

LEAKAGE CURRENT SPECTRUM;

SEMICONDUCTOR DEVICES;

EID: 0031634558     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)