Measurement of thermal properties of thin dielectric films and anisotropic solids by AC hot-strip method

Ferroelectrics

Volumn 208 /209, Issue 1 /4,1/2, 1998, Pages 279-292

  Davitadze, S T ^a   Kravchun, S N ^a   Mizina, N S ^a   Strukov, B A ^a   Goltsman, B M ^a   Lemanov, V V ^a   Shulman, S G ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; DEPOSITION; DIFFUSION; ELECTRIC FIELD EFFECTS; SPECIFIC HEAT OF SOLIDS; SPUTTERING; TEMPERATURE; THERMAL CONDUCTIVITY; THERMAL VARIABLES MEASUREMENT; THERMODYNAMIC PROPERTIES; THIN FILMS;

AC HOT STRIP METHOD; TEMPERATURE OSCILLATIONS; THERMAL DIFFUSIVITY;

DIELECTRIC FILMS;

EID: 0031634290     PISSN: 00150193     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/00150199808014881     Document Type: Article

References (4)