Improving the sensitivity of PMOS dosimeters using dual dielectrics

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 282-287

  O'Connell, B ^a   Enright, A ^a   Conneely, C ^a   Lane, W ^a   Adams, L ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC DEVICES; GATES (TRANSISTOR); IRRADIATION; MOS DEVICES; OXIDATION; PLASMA ETCHING; THRESHOLD VOLTAGE;

DUAL DIELECTRICS; IRRADIATION TESTING; THERMAL OXIDATION;

DOSIMETERS;

EID: 0031633624     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)