In-situ diagnostics at high pressures: ellipsometric and RHEED studies of the growth of YBa2Cu3O7

Materials Research Society Symposium - Proceedings

Volumn 502, Issue , 1998, Pages 237-247

  Blank, Dave H A ^a   Rogalla, Horst ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; EPITAXIAL GROWTH; HIGH PRESSURE EFFECTS; OXIDATION; OXIDE SUPERCONDUCTORS; PULSED LASER APPLICATIONS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING FILMS; SPUTTER DEPOSITION; STRONTIUM COMPOUNDS; YTTRIUM COMPOUNDS;

HETEROEPITAXIAL GROWTH; PULSED LASER DEPOSITION;

FILM GROWTH;

EID: 0031633532     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)