ESCA microscopy on ELETTRA: Chemical characterization of surfaces and interfaces with sub-micron spatial resolution

Materials Research Society Symposium - Proceedings

Volumn 524, Issue , 1998, Pages 203-214

  Kiskinova, M ^a   Casalis, L ^a   Gregoratti, L ^a   Gunther, S ^a   Marsi, M ^a  

^a SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; ELECTRON ENERGY LEVELS; INTERFACES (MATERIALS); MASS TRANSFER; PHASE COMPOSITION; PHOTOELECTRON SPECTROSCOPY; SYNCHROTRON RADIATION;

ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS (ESCA); PHOTOELECTRON SPECTROMICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0031633319     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-524-203     Document Type: Conference Paper

References (29)