Scaling issues in lateral power MOSFETs

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1998, Pages 329-332

  Darwish, Mohamed ^a   Huang, John ^a   Liu, Minxuan ^a   Shekar, M S ^a   Williams, Richard ^a   Cornell, Mike ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; POWER ELECTRONICS;

METAL INTERCONNECTS;

MOSFET DEVICES;

EID: 0031633231     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)