OPTVIEW: A new approach for examining optimized code

ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering

Volumn , Issue , 1998, Pages 19-26

  Tice, Caroline ^a   Graham, Susan L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY CODES; COMPUTER SOFTWARE SELECTION AND EVALUATION; PROGRAM COMPILERS; PROGRAM DEBUGGING;

SOFTWARE PACKAGE OPTVIEW;

COMPUTER AIDED SOFTWARE ENGINEERING;

EID: 0031633195     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)