Accurate broadband characterization of transmission lines

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 1998, Pages 933-936

  Shih, Y C ^a   Kong, K S ^a  

^a MMCOMM Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC IMPEDANCE; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; MEASUREMENT ERRORS; SENSITIVITY ANALYSIS;

TRANSMISSION-LINE PARAMETERS;

ELECTROMAGNETIC WAVE PROPAGATION;

EID: 0031632804     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)