Single event latchup protection of integrated circuits

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 327-331

  Layton, P J ^a   Czajkowski, D R ^a   Marshall, J C ^a   Anthony, H F D ^a   Boss, R W ^a  

^a Universal Electronics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; INTEGRATED CIRCUIT TESTING; LOGIC GATES; MULTICHIP MODULES; RADIATION EFFECTS; SPACE APPLICATIONS;

FLASH PROGRAMMABLE GATE ARRAY; LATCHUP PROTECTION TECHNOLOGY; SINGLE EVENT LATCHUP PROTECTION CIRCUIT;

RADIATION PROTECTION;

EID: 0031632611     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)