Coexistence of pseudomorphic and coincidence phases in nickel monolayers

Surface Science

Volumn 402-404, Issue , 1998, Pages 636-640

  Schmidthals, C ^a   Enders, A ^a   Sander, D ^a   Kirschner, J ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Coincidence structure; Low energy electron diffraction (LEED); Nickel; Scanning tunneling microscopy (STM); Tungsten

Indexed keywords

ANNEALING; DEFECTS; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; TUNGSTEN;

COINCIDENCE STRUCTURE;

NICKEL;

EID: 0031632104     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00921-7     Document Type: Article

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