±30% tuning range varactor compatible with future scaled technologies

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 1998, Pages 34-37

  Castello, R ^a   Erratico, P ^a   Manzini, S ^a   Svelto, F ^a  

^a UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT MANUFACTURE; OXIDES; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; TUNING;

QUALITY FACTORS;

VARACTORS;

EID: 0031631228     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)