Radiation damage of InGaAs photodiodes by high energy particles

Materials Research Society Symposium - Proceedings

Volumn 487, Issue , 1998, Pages 471-476

  Kudou, T ^a   Ohyama, H ^a   Simoen, E ^a   Claeys, C ^a   Takami, Y ^a   Shigaki, K ^a   Fujii, A ^a   Sunaga, H ^a  

^a KUMAMOTO NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMS; CRYSTAL DEFECTS; DEGRADATION; ELECTRONS; ENERGY DISSIPATION; HIGH ENERGY PHYSICS; NEUTRONS; RADIATION DAMAGE; SEMICONDUCTING INDIUM COMPOUNDS;

ISOCHRONAL ANNEALING; NONIONIZING ENERGY LOSS (NIEL);

PHOTODIODES;

EID: 0031629827     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)