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Volumn 2, Issue , 1998, Pages 369-372
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Novel method to measure the contamination level of insulators - spot contamination measurement
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTAMINATION;
HYDROPHOBICITY;
SPOT CONTAMINATION MEASUREMENT (SCM);
ELECTRIC INSULATING MATERIALS;
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EID: 0031629475
PISSN: 01642006
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (6)
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