Suitability of COTS IBM 64M DRAM in space

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 240-244

  Fox, Andrew J ^a   Abare, Wayne E ^a   Ross, Alan ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRONIC EQUIPMENT TESTING; RECORDING INSTRUMENTS; SATELLITES; SOLID STATE DEVICES; SPACE APPLICATIONS;

HEAVY ION TESTING; SOLID STATE DIGITAL RECORDER; TOTAL DOSE TESTING;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0031628565     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)