메뉴 건너뛰기




Volumn , Issue , 1998, Pages 619-624

Fast state verification

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; DESIGN; ALGORITHMS; BINARY CODES; FINITE AUTOMATA; HEURISTIC METHODS;

EID: 0031628340     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/277044.277205     Document Type: Conference Paper
Times cited : (6)

References (13)
  • 1
    • 0030212784 scopus 로고    scopus 로고
    • Principles and methods of testing finite state machines-a survey
    • August
    • D. Lee and M. Yannakakis, "Principles and Methods of Testing Finite State Machines-A Survey, " Proceedings of IEEE, vol. 84, No.8, pp. 1090-1122, August, 1996.
    • (1996) Proceedings of IEEE , vol.84 , Issue.8 , pp. 1090-1122
    • Lee, D.1    Yannakakis, M.2
  • 2
    • 0028387427 scopus 로고
    • Testing finite state machines: State identification and verification
    • D. Lee and M. Yannakakis, "Testing finite state machines: State identification and verification, " IEEE Trans. Computers, vol. 43, No.3, pp. 306-320, 1994.
    • (1994) IEEE Trans. Computers , vol.43 , Issue.3 , pp. 306-320
    • Lee, D.1    Yannakakis, M.2
  • 3
    • 0026260631 scopus 로고
    • An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours
    • A. V. Aho, A. T. Dahbura, D. Lee and M. U. Uyar, "An Optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours, " IEEE Trans. Communications, vol. 39, No.3, pp. 1604-1615, 1991.
    • (1991) IEEE Trans. Communications , vol.39 , Issue.3 , pp. 1604-1615
    • Aho, A.V.1    Dahbura, A.T.2    Lee, D.3    Uyar, M.U.4
  • 4
    • 0025480160 scopus 로고
    • Functional test generation for finite state machines
    • September
    • K. T. Cheng and J. Y. Jou, "Functional Test Generation for Finite State Machines, " International Test Conference, September 1990.
    • (1990) International Test Conference
    • Cheng, K.T.1    Jou, J.Y.2
  • 5
    • 0023834225 scopus 로고
    • A protocol test generation procedure
    • K. Sabnani and A. Dahbura, "A Protocol Test Generation Procedure, " Computer Networks, vol.15, pp285-297, 1988.
    • (1988) Computer Networks , vol.15 , pp. 285-297
    • Sabnani, K.1    Dahbura, A.2
  • 6
    • 0015145477 scopus 로고
    • Checking experiments for sequential machines
    • Oct
    • E. Hsieh, "Checking Experiments for Sequential Machines, " IEEE Trans. Computers, vol. C-20, pp.1152-1166, Oct. 1971.
    • (1971) IEEE Trans. Computers , vol.C-20 , pp. 1152-1166
    • Hsieh, E.1
  • 7
    • 0026175222 scopus 로고
    • On achieving complete fault coverage for sequential machines using the transition fault model
    • I. Pomeranz and S. M. Reddy, "On achieving complete fault coverage for sequential machines using the transition fault model, " Proceedings DAC, pp. 341-346, 1991.
    • (1991) Proceedings DAC , pp. 341-346
    • Pomeranz, I.1    Reddy, S.M.2
  • 10
    • 33747830056 scopus 로고
    • Finite-state machine benchmark set
    • R. Lisanke, "Finite-state machine benchmark set, " Preliminary benchmark collection, 1987. Available at "http://www.cbl.ncsu.edu.
    • (1987) Preliminary Benchmark Collection
    • Lisanke, R.1
  • 11
    • 0002865451 scopus 로고
    • An optimization technique for protocol conformance test generation based on uio sequences and rural Chinese postman tours
    • North-Holland, Amsterdam
    • A. Aho, A.T. Dahbura, D.Lee and M. UmitUyar, "An optimization technique for protocol conformance test generation based on UIO sequences and Rural Chinese Postman Tours, " Protocol Specification, Testing and Verification, Vol. 8, North-Holland, Amsterdam, pp.131-143, 1988.
    • (1988) Protocol Specification, Testing and Verification , vol.8 , pp. 131-143
    • Aho, A.1    Dahbura, A.T.2    Lee, D.3    UmitUyar, M.4
  • 13
    • 0028561676 scopus 로고    scopus 로고
    • An approach for uio generation for FSM verification and validation
    • 1994
    • D. Schin, Y.-N. Shen and F. Lombardi, "An approach for UIO generation for FSM verification and validation, " Proc. ISCAS, vol. 4, pp.303-306, 1994.
    • Proc. ISCAS , vol.4 , pp. 303-306
    • Schin, D.1    Shen, Y.-N.2    Lombardi, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.