Phase noise in CMOS differential LC oscillators

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 1998, Pages 48-51

  Hajimiri, Ali ^a   Lee, Thomas H ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENT MEASUREMENT; ENERGY DISSIPATION; INTEGRATED CIRCUIT TESTING; POWER INDUCTORS; SPURIOUS SIGNAL NOISE; VOLTAGE MEASUREMENT;

PHASE NOISE;

VARIABLE FREQUENCY OSCILLATORS;

EID: 0031627660     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)