Three new mathematical techniques for field effect transistor modeling and analysis

Proceedings of the IEEE International Caracas Conference on Devices, Circuits and Systems, ICCDCS

Volumn , Issue , 1998, Pages 65-68

  Snider, Arthur David ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CAPACITANCE; CURVE FITTING; ELECTRIC NETWORK ANALYSIS; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; TRANSCONDUCTANCE;

CHARGE CONSERVATION; DATA SMOOTHING; LARGE SIGNAL DRAIN CURRENT; TRANSCAPACITANCE;

FIELD EFFECT TRANSISTORS;

EID: 0031627636     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)