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Volumn 6, Issue 1-4, 1998, Pages 385-391

Hierarchical process simulation for nano-electronics

Author keywords

Hierarchy; Interconnects; Parallel computing; Technology CAD

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; COMPUTER SOFTWARE; HIERARCHICAL SYSTEMS; MICROELECTRONIC PROCESSING; NANOSTRUCTURED MATERIALS;

EID: 0031625443     PISSN: 1065514X     EISSN: None     Source Type: Journal    
DOI: 10.1155/1998/19402     Document Type: Article
Times cited : (1)

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  • 5
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    • to appear in Nov.
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    • Park, H.1
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    • P. Smeys, P. B. Griffin, and K. C. Saraswat, "An Improved Calibration Methodology for Modeling Advanced Isolation Technologies," SISDEP'95 Tech. Digest, Sept. 6-8, 1995, pp. 42-45.
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    • Pein, H.1    Plummer, J.D.2
  • 8
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  • 10
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.