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Volumn 502, Issue , 1998, Pages 249-254
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RHEED monitoring of rotating samples during large-area homogeneous deposition of oxides
a
a
Conductus Inc
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(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
DEPOSITION;
FILM GROWTH;
HIGH TEMPERATURE SUPERCONDUCTORS;
OXIDE SUPERCONDUCTORS;
OXYGEN;
PRESSURE EFFECTS;
SUBSTRATES;
SUPERCONDUCTING FILMS;
ROTATING SUBSTRATE;
THIN FILM GROWTH;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
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EID: 0031625236
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (10)
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