EXEQ II and III: experiences acquired in the study of single events;EXEQ II et III: experiences embarquees pour l'etude des evenements singuliers

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 504-509

  Duzellier, S ^a   Falguere, D ^a   Ecoffet, R ^a   Tsourilo, I ^a  

^a ONERA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; MICROPROCESSOR CHIPS; PARTICLE DETECTORS; PROTON IRRADIATION; RADIATION EFFECTS; SPACE FLIGHT;

ERROR MAPPING; SINGLE EVENT EFFECTS; STATIC RANDOM ACCESS STORAGE;

DOSIMETRY;

EID: 0031625047     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)