Ohmic contacts to p-ZnSe using Pd metallization

Solid-State Electronics

Volumn 42, Issue 1, 1998, Pages 139-144

  Schwarz, Ralf ^a   Studnitzky, Thomas ^a   Goesmann, Fred ^a   Schmid Fetzer, Rainer ^a  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRIC RESISTANCE; METALLIZING; OPTICAL MICROSCOPY; PALLADIUM; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; STATISTICAL METHODS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ZINC SELENIDE;

OHMIC CONTACTS;

EID: 0031624684     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(97)00219-0     Document Type: Article

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