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Volumn Part F133492, Issue , 1998, Pages 707-712

Solder joint fatigue life of fleXBGATM assemblies

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; NETWORK COMPONENTS; SOLDERING ALLOYS; INTEGRATED CIRCUIT MANUFACTURE; SUBSTRATES;

EID: 0031624420     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.1998.678776     Document Type: Conference Paper
Times cited : (11)

References (9)
  • 1
    • 85053924875 scopus 로고    scopus 로고
    • July Tech Search International
    • BGA Update, July 1997, Tech Search International.
    • (1997) BGA Update
  • 2
    • 0343851308 scopus 로고    scopus 로고
    • Compliancy modeling of an area array chip scale package
    • J. Fjelstad, T. DiStefano, M. Perry, "Compliancy Modeling of An Area Array Chip Scale Package, " Proc SMI, 1996, pp. 236-243.
    • (1996) Proc SMI , pp. 236-243
    • Fjelstad, J.1    DiStefano, T.2    Perry, M.3
  • 3
    • 0000564167 scopus 로고
    • Thermal and power cycling limits of plastic ball grid array (pbga) assemblies
    • R. Darveaux and A. Mawer, "Thermal and Power Cycling Limits of Plastic Ball Grid Array (PBGA) Assemblies, " Proc. Surface Mount International, 1995, pp. 315-326.
    • (1995) Proc. Surface Mount International , pp. 315-326
    • Darveaux, R.1    Mawer, A.2
  • 4
    • 0042144587 scopus 로고    scopus 로고
    • The Effect of PBGA solder pad geometry on solder joint reliability
    • A. Mawer, D. Cho, R. Darveaux, "The Effect of PBGA Solder Pad Geometry on Solder Joint Reliability, " Proc. SMI, 1996, pp. 127-135.
    • (1996) Proc. SMI , pp. 127-135
    • Mawer, A.1    Cho, D.2    Darveaux, R.3
  • 5
    • 0029217431 scopus 로고
    • Optimizing the reliability of thin small outline package (TSOP) Solder joints
    • Proc. ASME Interpack '95
    • R. Darveaux, "Optimizing the Reliability of Thin Small Outline Package (TSOP) Solder Joints, " Advances in Electronic Packaging 1995-Proc. ASME Interpack '95, pp. 675-685.
    • (1995) Advances in Electronic Packaging , pp. 675-685
    • Darveaux, R.1
  • 6
    • 0003726306 scopus 로고
    • Designed experiment to determine attachment reliability drivers for PBGA Packages
    • T. Ejim, A. Holliday, F. E. Bader, S. Gahr, "Designed Experiment to Determine Attachment Reliability Drivers for PBGA Packages, " Proc SMI, 1995, pp. 385-392.
    • (1995) Proc SMI , pp. 385-392
    • Ejim, T.1    Holliday, A.2    Bader, F.E.3    Gahr, S.4
  • 8
    • 0343415304 scopus 로고    scopus 로고
    • Electrical performace and reliability of TBGA with grounded stiffener
    • R. D. Schueller, et. al., "Electrical Performace and Reliability of TBGA with Grounded Stiffener, " Proc SMI, 1997, pp. 16-27.
    • (1997) Proc SMI , pp. 16-27
    • Schueller, R.D.1
  • 9
    • 0343851307 scopus 로고
    • Failure mode analysis of a 540 pin plastic ball grid array
    • A. I. Atterwalla and R. Stierman, "Failure Mode Analysis of a 540 Pin Plastic Ball Grid Array, " Proc SMI, 1994, pp 252-257
    • (1994) Proc SMI , pp. 252-257
    • Atterwalla, A.I.1    Stierman, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.