Alternative approach for modeling the hot carrier degradation of the Si/SiO2 interface

Materials Research Society Symposium - Proceedings

Volumn 513, Issue , 1998, Pages 313-317

  Chen, Zhi ^a   Lee, Jinju ^a   Lyding, Joseph W ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HOT CARRIERS; INTERFACES (MATERIALS); SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR INSULATOR BOUNDARIES; SILICA;

INTERFACE TRAP GENERATION;

MOS DEVICES;

EID: 0031621998     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-513-313     Document Type: Conference Paper

References (16)