New variational method to determine effective channel length and series resistance of MOSFET's

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1998, Pages 123-126

  Yamaguchi, K ^a   Amishiro, H ^a   Yamawaki, M ^a   Asai, S ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; VARIATIONAL TECHNIQUES;

CHANNEL LENGTH; SERIES RESISTANCE;

MOSFET DEVICES;

EID: 0031621743     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)