High density integrated test matrix of MOS transistors for matching study

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1998, Pages 19-24

  Portmann, Lionel ^a   Lallement, Christophe ^a   Krummenacher, Francois ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR SWITCHES; SHIFT REGISTERS; SILICON ON INSULATOR TECHNOLOGY;

ANALOG SWITCHES; TRANSISTOR MATCHING;

MOSFET DEVICES;

EID: 0031621738     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)