Nondestructive inspection of thin, low-Z samples using multiplexed Compton scatter tomography

Materials Research Society Symposium - Proceedings

Volumn 503, Issue , 1998, Pages 297-308

  Evans, B L ^a   Martin, J B ^a   Burggraf, L W ^a  

^a AIR FORCE INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ALUMINUM CORROSION; ELECTROMAGNETIC WAVE BACKSCATTERING; GAMMA RAYS; IMAGE RECONSTRUCTION; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION; OPTICAL RESOLVING POWER; PHOTONS; TOMOGRAPHY;

COMPTON BROADENING EFFECTS; MULTIPLEXED COMPTON SCATTER TOMOGRAPHY;

AIRCRAFT MATERIALS;

EID: 0031621260     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)