Issues in emissivity of silicon

Materials Research Society Symposium - Proceedings

Volumn 525, Issue , 1998, Pages 95-102

  Abedrabbo, S ^a   Hensel, J C ^a   Gokce, O H ^a   Tong, F M ^a   Sopori, B ^a   Fiory, A T ^a   Ravindra, N M ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT EMISSION; LIGHT MEASUREMENT; SURFACE ROUGHNESS; THERMAL EFFECTS;

SPECTRAL EMISSOMETERS;

SILICON WAFERS;

EID: 0031621068     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-525-95     Document Type: Conference Paper

References (13)