Temperature distribution at the sample surface in high-temperature XRD using infrared thermography

Materials Science Forum

Volumn 278-281, Issue PART 1, 1998, Pages 254-259

  Fischer, W ^a   Lersch, P ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Diffraction; High Temperature; Infrared Measurement; Thermography; X Ray

Indexed keywords

DIFFRACTION; SYSTEMATIC ERRORS; TEMPERATURE MEASUREMENT; THERMOCOUPLES; THERMOGRAPHY (TEMPERATURE MEASUREMENT); X RAY DIFFRACTION; X RAYS; DIFFRACTOMETERS; ERROR ANALYSIS; MEASUREMENT ERRORS; MORPHOLOGY; PHASE TRANSITIONS; TEMPERATURE DISTRIBUTION;

HIGH TEMPERATURE; HIGH-TEMPERATURE IN SITU; HIGH-TEMPERATURE XRD; INFRARED MEASUREMENTS; SAMPLE TEMPERATURE; STRUCTURAL TRANSFORMATION; TEMPERATURE DATA; THERMAL FLUCTUATIONS;

THERMOGRAPHY (IMAGING); X RAY DIFFRACTION ANALYSIS;

HIGH TEMPERATURE X RAY DIFFRACTION; STRUCTURAL TRANSFORMATIONS;

EID: 0031620805     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.278-281.254     Document Type: Article

References (10)

1. th Annual Denver X-Ray Conference, Denver/Colorado, Aug. 1996, Book of Abstracts p.223
2. th Annual Denver X-Ray Conference, Denver/Colorado, Aug. 1996, Book of Abstracts p.185
3. Paar Physica (Graz/Austria), Non-Ambient X-Ray Diffraction, Product Info XXIP02 and B40IP01-A
4. Edmund Buehler GmbH (Bodelshausen/Germany), X-Ray Powder Diffraction, Product Info Materials Science
5. th European Powder Diffraction Conference, Parma/Italy, May 1997, Book of Abstracts p.200
6. th European Powder Diffraction Conference, Parma/Italy, May 1997, Book of Abstracts p. 124
7. th Annual Denver X-Ray Conference, Denver/Colorado, Aug. 1996, Book of Abstracts p.121
8. Paar Physica (Graz/Austria), HTK 16 High-Temperature Attachment, Product Info B34IE08-A, 9/95
9. J.H.Taylor, Radiation exchange, Academic Press Inc., San Diego 1990
10. K.Stahl und G.Miosga, Infrarottechnik, Huethig-Verlag, Heidelberg 1980