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Volumn 278-281, Issue PART 2, 1998, Pages 879-884

Microstructural study of nanocrystalline CeO2 by X-ray powder diffraction and high resolution transmission electron microscopy

Author keywords

Inert Gas Condensation; Microstructure; Nanocrystalline Ceria; Transmission Electron Microscopy; X Ray Powder Diffraction

Indexed keywords

ANNEALING; COALESCENCE; CONDENSATION; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; DECOMPOSITION; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; POWDERS; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION; CERIUM OXIDE; CRYSTALLITES; INERT GASES; MICROSTRUCTURE; NANOCRYSTALLINE POWDERS; NANOCRYSTALS;

EID: 0031620718     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article
Times cited : (2)

References (15)
  • 7
    • 0001185753 scopus 로고
    • ed. E. Prince and J.K. Stalick (NIST Spec. public. 846, Gaithersburg)
    • J.I. Langford, Accuracy in Powder Diffraction II, ed. E. Prince and J.K. Stalick (NIST Spec. public. 846, Gaithersburg), pp. 110-126 (1992).
    • (1992) Accuracy in Powder Diffraction II , pp. 110-126
    • Langford, J.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.