Full-wave approach to the modeling of discontinuities of real conductors in planar lossy lines for MMIC applications

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1998, Pages 1555-1558

  Farina, M ^a   Rozzi, T ^a  

^a UNIVERSITÀ POLITECNICA DELLE MARCHE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC CONDUCTORS; GREEN'S FUNCTION; INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICE MODELS; SUBSTRATES;

FULL-WAVE ANALYSIS; PLANAR LINES;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0031619851     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)