Thermal testing on programmable logic devices

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 2, Issue , 1998, Pages 240-243

  Lopez Buedo, Sergio ^a   Garrido, Javier ^a   Boemo, Eduardo ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL EQUIPMENT; FIELD PROGRAMMABLE GATE ARRAYS; INTEGRATED CIRCUIT TESTING; OSCILLATORS (ELECTRONIC); SENSORS; SIGNAL DETECTION; TRANSDUCERS;

RING OSCILLATORS; THERMAL TRANSDUCERS;

TEMPERATURE MEASUREMENT;

EID: 0031619498     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)