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Volumn , Issue , 1998, Pages 251-258
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Single-event-effect behaviour of commercial-off-the-shelf memory devices - a decade in low-earth orbit
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA STORAGE EQUIPMENT;
DOSIMETERS;
ELECTRONIC EQUIPMENT TESTING;
IONIZING RADIATION;
IONS;
PROTONS;
SATELLITES;
IONIZING PARTICLE;
SOLID STATE DOSIMETERS;
RADIATION EFFECTS;
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EID: 0031619057
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (20)
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