Low power SRAM using auto-backgate-controlled MT-CMOS

Proceedings of the International Symposium on Low Power Design

Volumn , Issue , 1998, Pages 293-298

  Nii, Koji ^a   Makino, Hiroshi ^a   Tujihashi, Yoshiki ^a   Morishima, Chikayoshi ^a   Hayakawa, Yasushi ^a   Nunogami, Hiroyuki ^a   Arakawa, Takahiko ^a   Hamano, Hisanori ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; THRESHOLD VOLTAGE;

AUTO-BACKGATE-CONTROLLED MULTI THRESHOLD CMOS; CHARGE PUMP CIRCUIT;

RANDOM ACCESS STORAGE;

EID: 0031618603     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)