Visualization and control of Si nanoparticle behavior in laser-ablation plume

Conference on Lasers and Electro-Optics Europe - Technical Digest

Volumn , Issue , 1998, Pages 357-358

  Muramoto, Junichi ^a   Nakata, Yoshiki ^a   Okada, Tatsuo ^a   Maeda, Mitsuo ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VARIABLES CONTROL; DEPOSITION; ELECTRIC FIELD EFFECTS; EXCIMER LASERS; LASER APPLICATIONS; NANOSTRUCTURED MATERIALS; PARTICLES (PARTICULATE MATTER); PROBES; RAYLEIGH SCATTERING; SILICON; VISUALIZATION;

FLUORESCENCE IMAGING SYSTEMS; KRYPTON FLUORIDE EXCIMER LASERS; LASER ABLATION PLUME; PROBE EXCITATION LASER;

LASER ABLATION;

EID: 0031618244     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/cleo.1998.676296     Document Type: Conference Paper

References (1)