Particle deposition measurements using silicon wafer witness plates and a laser scanner

Institute of Environmental Sciences - Proceedings, Annual Technical Meeting

Volumn , Issue , 1998, Pages 40-47

  Borson, E N ^a   Schwindt, C J ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSPACE APPLICATIONS; CALCULATIONS; DEPOSITION; PARTICLE SIZE ANALYSIS; PARTICLES (PARTICULATE MATTER); SILICON WAFERS; TELESCOPES;

HUBBLE SPACE TELESCOPE SERVICING MISSION; LASER SCANNER; PARTICLE DEPOSITION MEASUREMENT; SPACE SYSTEMS;

RADIATION COUNTERS;

EID: 0031617611     PISSN: 00739227     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)