Quantitative interface roughness analysis of Fe/Cr superlattices

Superlattices and Microstructures

Volumn 24, Issue 3, 1998, Pages 239-247

  Schad, Rainer ^a   Belien, P ^b,f   Verbanck, G ^b   Temst, K ^b   Moshchalkov, V V ^b   Bruynseraede, Y ^b   Fischer, H ^c   Lefebvre, S ^d   Bessiere, M ^d   Bahr, D ^e,g   Falta, J ^e   Dekoster, J ^b   Langouche, G ^b  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c INSTITUT LAUE LANGEVIN   (France)

^d UNIVERSITÉ PARIS SACLAY   (France)

^e DESY   (Germany)

^f PHILIPS RESEARCH LABORATORIES   (Netherlands)

^g BRUKER AXS GMBH   (Germany)

Author keywords

Interface structure; Magnetism; Multilayers; X ray diffraction

Indexed keywords

CHROMIUM; ELECTRON SPECTROSCOPY; INTERFACES (MATERIALS); IRON; MAGNETISM; MOSSBAUER SPECTROSCOPY; SURFACE ROUGHNESS; TRANSPORT PROPERTIES; X RAY DIFFRACTION ANALYSIS;

INTERFACE ROUGHNESS;

METALLIC SUPERLATTICES;

EID: 0031617421     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.1998.0581     Document Type: Article

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