Characterization of intercalated smectites using XRD profile analysis in the low-angle region

Clays and Clay Minerals

Volumn 46, Issue 1, 1998, Pages 63-68

  Janeba, Daniel ^a   Čapková, Pavla ^a   Weiss, Zdeněk ^b   Schenk, Henk ^c  

^a CHARLES UNIVERSITY   (Czech Republic)

^b VSB TECHNICAL UNIVERSITY OF OSTRAVA   (Czech Republic)

^c UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

Montmorillonite; Profile Analysis; Smectite; XRD

Indexed keywords

SMECTITE; XRD;

INTERCALATION COMPOUNDS; LATTICE CONSTANTS; MATHEMATICAL MODELS; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

DIFFRACTION GEOMETRY; FULL WIDTH AT HALF MAXIMUM (FWHM); LORENTZ POLARIZATION FACTOR; MONTMORILLONITE; SMECTITE;

CLAY MINERALS;

EID: 0031597213     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/CCMN.1998.0460107     Document Type: Article

References (11)

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