A simple hardware model for the direct observation of voltage-clamp performance under realistic conditions

Journal of Neuroscience Methods

Volumn 78, Issue 1-2, 1997, Pages 105-113

  Draguhn, A ^a   Pfeiffer, M ^a   Heinemann, U ^a   Polder, R ^b  

^a CHARITÉ UNIVERSITÄTSMEDIZIN BERLIN   (Germany)

^b NPI Electronic GmbH   (Germany)

Author keywords

Cell model; Patch clamp; Simulation; Synaptic current; Voltage clamp

Indexed keywords

ACCURACY; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER MODEL; ELECTROPHYSIOLOGY; PRIORITY JOURNAL; SIMULATION; SYNAPSE; VOLTAGE CLAMP;

ANIMALS; CALIBRATION; CELL MEMBRANE; DENDRITES; ELECTRIC CONDUCTIVITY; MEMBRANE POTENTIALS; MICROCOMPUTERS; MODELS, NEUROLOGICAL; PATCH-CLAMP TECHNIQUES; SYNAPSES;

EID: 0031592336     PISSN: 01650270     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0165-0270(97)00138-6     Document Type: Article

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