Accurate quantification of quartz and other phases by powder X-ray diffractometry

Analytica Chimica Acta

Volumn 337, Issue 3, 1997, Pages 233-252

  Hurst, Vernon J ^a   Schroeder, Paul A ^a   Styron, Robert W ^b  

^a UNIVERSITY OF GEORGIA   (United States)

^b Mineral Resource Technologies   (United States)

Author keywords

Crystalline silica; Fly ash; Quantification; Quartz; Review; X ray diffraction

Indexed keywords

SILICON DIOXIDE;

ACCURACY; ANALYTIC METHOD; CRYSTAL; FLY ASH; PRIORITY JOURNAL; QUANTITATIVE ASSAY; REVIEW; X RAY DIFFRACTION;

EID: 0031590951     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0003-2670(96)00425-4     Document Type: Review

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