Ion chemistry in trifluoromethane, CHF3

Chemical Physics Letters

Volumn 269, Issue 1-2, 1997, Pages 117-121

  Jiao, C Q ^a   Nagpal, R ^b   Haaland, P D ^b  

^a Mobium Enterprises Inc   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031585980     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(97)00253-4     Document Type: Article

References (35)

1. [1] M.T. Mocella, Solid State Tech. 4 (1991) 63.
2. [2] D.L. Hobrock and R.W. Kiser, J. Phys. Chem. 68 (1964) 575.
3. [3] J.A. Beran and L. Kevan, J. Phys. Chem. 73 (1969) 3866.
4. [4] H.F. Winters and M. Inokuti, Phys. Rev. A 25 (1982) 1420.
5. [5] H.U. Poll and J. Meichsner, Contrib. Plasma Phys. 27 (1987) 359.
6. [6] M. Goto, K. Nakamura, H. Toyoda and H. Sugai, Jpn. J. Appl. Phys. 33 (1994) 3602.
7. [7] T.G. Lee, J. Phys. Chem. 67 (1963) 360.
8. [8] R.M. Reese, V.H. Dibeler and F.L. Mohler, J. Res. Nat. Bur. Stand. 57 (1956) 367.
9. [9] K.A.G. MacNeil and J.C.J. Thynne, Trans. Faraday Soc. 64 (1968) 2112.
10. [10] K.A.G. MacNeil and J.C.J. Thynne, Int. J. Mass Spectrom. Ion Phys. 2 (1969) 1.
11. [11] R.P. Blaunstein and L.G. Christophorou, J. Chem. Phys. 49 (1968) 1526.
12. [12] R.W. Fessenden and K.M. Bansal, J. Chem. Phys. 53 (1970) 3468.
13. [13] F.J. Davis, R.N. Compton and D.R. Nelson, J. Chem. Phys. 59 (1973) 2324.
14. [14] H.-U. Schenuemann, M.H.E. Illenberger and H. Baumgartel, Ber. Bunsenges. Phys. Chem. 86 (1982) 321.
15. [15] M. Haverlag, A. Kono, D. Passchier, G.M.W. Kroesen, W.J. Goedhear and F.J. de Hoog, J. Appl. Phys 70 (1991) 3472.
16. [16] N.A. McAskill, Aust. J. Chem. 23 (1970) 893.
17. [17] T.B. McMahon, R.J. Blint, D.P. Ridge and J.L. Beauchamp, J. Am. Chem. Soc. 94 (1972) 8934.
18. [18] EPA/NIH Mass Spectral Data Base NSRDS-NBS63 (National Bureau of Standards, Washington, 1987).
19. [19] R.J. Blint, T.B. McMahon and J.L. Beauchamp, J. Am. Chem. Soc. 96 (1974) 1269.
20. [20] M.J.K. Pabst, H.S. Tan and J.L. Franklin, Int. J. Mass Spectrom. Ion Phys. 20 (1976) 191.
21. [21] S.G. Lias and P. Ausloos, Int. J. Mass Spectrom. Ion Phys. 23 (1977) 273.
22. [22] M. Chau and M.T. Bowers, Int. J. Mass Spectrom. Ion Phys. 24 (1977) 191.
23. [23] T.O. Tiernan, C. Chang and C.C. Cheng, Envir. Heal. Presp. 36 (1980) 47.
24. [24] S. McGinnis, K. Riel and P.D. Haaland, Chem. Phys. Lett. 232 (1994) 99.
25. [25] J. Holtgrave, K. Riehl, D. Abner and P.D. Haaland, Chem. Phys. Lett. 215 (1993) 548.
26. [26] P.D. Haaland, J. Chem. Phys. 93 (1990) 4066.
27. [27] P.D. Haaland, Chem. Phys. Lett. 170 (1990) 146.
28. [28] C.Q. Jiao, R. Nagpal and P.D. Haaland, Chem. Phys. Lett., submitted.
29. [29] K. Riehl, Collisional detachment of negative ions using FTMS, Ph.D. Thesis, Air Force Institute of Technology (1992).
30. [30] A.G. Marshall, T.L. Wang and T.L. Ricca, J. Am. Chem. Soc. 107 (1985) 7893; S. Guan, J. Chem. Phys. 91 (1989) 775.
31. [30] A.G. Marshall, T.L. Wang and T.L. Ricca, J. Am. Chem. Soc. 107 (1985) 7893; S. Guan, J. Chem. Phys. 91 (1989) 775.
32. [31] P.D. Haaland, Chem. Phys. Lett. 170 (1990) 146.
33. [32] R.C. Wetzel, F.A. Baiocchi, T.R. Hays and R.C. Freund, Phys. Rev. A 35 (1987) 559.
34. [33] E. Krishnakumar and S.K. Srivastava, J. Phys. B 21 (1988) 1055.
35. [34] B.V. McKoy, California Institute of Technology, personal communication, June 1996.