Multiangle imaging spectroradiometer: Optical characterization of the calibration panels

Applied Optics

Volumn 36, Issue 27, 1997, Pages 7016-7022

  McGuckin, Brendan T ^a   Haner, David A ^b   Menzies, Robert T ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b CALIFORNIA STATE POLYTECHNIC UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; LASERS; LIGHT MEASUREMENT; LIGHT SCATTERING; MATHEMATICAL MODELS; SPECTROMETERS;

LAMBERTIAN SURFACE; MULTIANGLE IMAGING SPECTRORADIOMETER; REFLECTANCE ANISOTROPY; RELATIVE BIDIRECTIONAL REFLECTANCE FACTOR;

LIGHT REFLECTION;

BIDIRECTIONAL REFLECTANCE; CALIBRATION; REMOTE SENSING; SPECTRORADIOMETER;

EID: 0031580567     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.007016     Document Type: Article

References (7)

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