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Volumn 40, Issue 2, 1997, Pages 147-152
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Defects in amorphous Si1-xGex alloys: An explanation of electron spin resonance signals
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031572673
PISSN: 02955075
EISSN: None
Source Type: Journal
DOI: 10.1209/epl/i1997-00437-y Document Type: Article |
Times cited : (2)
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References (27)
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