-
1
-
-
0010932112
-
Reliability growth during a development test program
-
Barlow, R.E. and E.M. Scheuer (1966). Reliability growth during a development test program. Technometrics 8, 53-60.
-
(1966)
Technometrics
, vol.8
, pp. 53-60
-
-
Barlow, R.E.1
Scheuer, E.M.2
-
2
-
-
0010930686
-
Recent developments in Bayesian sequential reliability demonstration tests
-
A.P. Basu, Ed., Elsevier, Amsterdam
-
Berger, J.O. and D. Sun (1993). Recent developments in Bayesian sequential reliability demonstration tests. In: A.P. Basu, Ed., Advances in Reliability. Elsevier, Amsterdam, 379-393.
-
(1993)
Advances in Reliability
, pp. 379-393
-
-
Berger, J.O.1
Sun, D.2
-
3
-
-
0020985395
-
A logarithmic reliability growth model for single mission systems
-
Finkelstein, J.M. (1983). A logarithmic reliability growth model for single mission systems. IEEE Trans. Reliabi. R32, 508-511.
-
(1983)
IEEE Trans. Reliabi.
, vol.R32
, pp. 508-511
-
-
Finkelstein, J.M.1
-
4
-
-
0010887877
-
A semi-parametric approach to testing for reliability growth with application to software systems
-
Kenett, R. and M. Pollak (1986). A semi-parametric approach to testing for reliability growth with application to software systems. IEEE Trans. Reliabi. R35, 304-311.
-
(1986)
IEEE Trans. Reliabi.
, vol.R35
, pp. 304-311
-
-
Kenett, R.1
Pollak, M.2
-
6
-
-
0003468085
-
-
Prentice-Hall, Englewood Cliffs, NJ
-
Lloyd, D.K. and M. Lipow (1963). Reliability: Management, Methods, and Mathematics. Prentice-Hall, Englewood Cliffs, NJ.
-
(1963)
Reliability: Management, Methods, and Mathematics
-
-
Lloyd, D.K.1
Lipow, M.2
-
8
-
-
0027664378
-
A Bayes methodology for assessing product reliability during development testing
-
Mazzuchi, T.A. and R. Soyer (1993). A Bayes methodology for assessing product reliability during development testing. IEEE Trans. Reliabi. R42, 503-510.
-
(1993)
IEEE Trans. Reliabi.
, vol.R42
, pp. 503-510
-
-
Mazzuchi, T.A.1
Soyer, R.2
-
9
-
-
0026834418
-
Reliability-growth myths and methodologies: A critical view
-
Meth, M. (1992). Reliability-growth myths and methodologies: a critical view. Proc. Ann. Reliability and Maintainability Symp., 337-341.
-
(1992)
Proc. Ann. Reliability and Maintainability Symp.
, pp. 337-341
-
-
Meth, M.1
-
10
-
-
0000385171
-
A bayesian reliability growth model
-
Pollock, S.M. (1968). A Bayesian reliability growth model. IEEE Trans. Reliabi. R17, 187-193.
-
(1968)
IEEE Trans. Reliabi.
, vol.R17
, pp. 187-193
-
-
Pollock, S.M.1
-
11
-
-
0017747169
-
A bayesian note on reliability growth during a development testing program
-
Smith, A.F.M. (1977). A Bayesian note on reliability growth during a development testing program. IEEE Trans. Reliabi. R26, 346-347.
-
(1977)
IEEE Trans. Reliabi.
, vol.R26
, pp. 346-347
-
-
Smith, A.F.M.1
|