메뉴 건너뛰기




Volumn 62, Issue 2, 1997, Pages 207-218

Sequential inference and decision making for single mission systems development

Author keywords

Dirichlet distribution; Dynamic programming; Optimal stopping; Reliability growth; Sequential bayesian inference

Indexed keywords


EID: 0031571514     PISSN: 03783758     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0378-3758(96)00182-6     Document Type: Article
Times cited : (8)

References (11)
  • 1
    • 0010932112 scopus 로고
    • Reliability growth during a development test program
    • Barlow, R.E. and E.M. Scheuer (1966). Reliability growth during a development test program. Technometrics 8, 53-60.
    • (1966) Technometrics , vol.8 , pp. 53-60
    • Barlow, R.E.1    Scheuer, E.M.2
  • 2
    • 0010930686 scopus 로고
    • Recent developments in Bayesian sequential reliability demonstration tests
    • A.P. Basu, Ed., Elsevier, Amsterdam
    • Berger, J.O. and D. Sun (1993). Recent developments in Bayesian sequential reliability demonstration tests. In: A.P. Basu, Ed., Advances in Reliability. Elsevier, Amsterdam, 379-393.
    • (1993) Advances in Reliability , pp. 379-393
    • Berger, J.O.1    Sun, D.2
  • 3
    • 0020985395 scopus 로고
    • A logarithmic reliability growth model for single mission systems
    • Finkelstein, J.M. (1983). A logarithmic reliability growth model for single mission systems. IEEE Trans. Reliabi. R32, 508-511.
    • (1983) IEEE Trans. Reliabi. , vol.R32 , pp. 508-511
    • Finkelstein, J.M.1
  • 4
    • 0010887877 scopus 로고
    • A semi-parametric approach to testing for reliability growth with application to software systems
    • Kenett, R. and M. Pollak (1986). A semi-parametric approach to testing for reliability growth with application to software systems. IEEE Trans. Reliabi. R35, 304-311.
    • (1986) IEEE Trans. Reliabi. , vol.R35 , pp. 304-311
    • Kenett, R.1    Pollak, M.2
  • 8
    • 0027664378 scopus 로고
    • A Bayes methodology for assessing product reliability during development testing
    • Mazzuchi, T.A. and R. Soyer (1993). A Bayes methodology for assessing product reliability during development testing. IEEE Trans. Reliabi. R42, 503-510.
    • (1993) IEEE Trans. Reliabi. , vol.R42 , pp. 503-510
    • Mazzuchi, T.A.1    Soyer, R.2
  • 9
  • 10
    • 0000385171 scopus 로고
    • A bayesian reliability growth model
    • Pollock, S.M. (1968). A Bayesian reliability growth model. IEEE Trans. Reliabi. R17, 187-193.
    • (1968) IEEE Trans. Reliabi. , vol.R17 , pp. 187-193
    • Pollock, S.M.1
  • 11
    • 0017747169 scopus 로고
    • A bayesian note on reliability growth during a development testing program
    • Smith, A.F.M. (1977). A Bayesian note on reliability growth during a development testing program. IEEE Trans. Reliabi. R26, 346-347.
    • (1977) IEEE Trans. Reliabi. , vol.R26 , pp. 346-347
    • Smith, A.F.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.