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Volumn 64, Issue 6, 1997, Pages 1053-1059
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Tensile mechanical properties of PEEK films over a wide range of strain rates. II
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS FILMS;
ANELASTIC RELAXATION;
CRYSTAL MICROSTRUCTURE;
ELASTIC MODULI;
MONOMERS;
PLASTIC DEFORMATION;
POLYETHER ETHER KETONES;
SPECTROMETRY;
STRAIN RATE;
TENSILE PROPERTIES;
TENSILE TESTING;
YIELD STRESS;
DYNAMIC MECHANICAL SPECTROMETRY;
EYRING ANALYSIS;
PLASTIC FILMS;
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EID: 0031560738
PISSN: 00218995
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1097-4628(19970509)64:6<1053::AID-APP3>3.0.CO;2-K Document Type: Article |
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Times cited : (32)
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References (28)
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