Scanning tunneling spectroscopy of Ag-As-Se ion-conducting glasses

Applied Physics Letters

Volumn 71, Issue 23, 1997, Pages 3409-3411

  Ohto, M ^a   Tanaka, K ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRONIC DENSITY OF STATES; ENERGY GAP; IONS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; TERNARY SYSTEMS;

ION CONDUCTING GLASSES; MELT QUENCHING METHOD; SCANNING TUNNELING SPECTROSCOPY;

SEMICONDUCTING GLASS;

EID: 0031560359     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120350     Document Type: Article

References (17)

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10. More precisely, no topological changes were detected through STM images, which could be obtained ∼30 s after STS measurements. However, abrupt current increases at V≃ - 1 V [corresponding to the dotted line in Fig. 1(a)] and -0.5 V (Fig. 2) indicate formation of electrical contacts between a tip and a sample. These observations suggest that a hillock consisting of Ag with height of 1-2 nm is formed under the negative voltages and it disappears within 30 s through thermal diffusion.
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14. Similar measurements to that reported in Ref. 15 were tried, while clear signals could not be obtained in Se systems.
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16. 39 sample having a small Au electrode on its surface was prepared. The electrode was imaged under a tip bias of 1 V and a tunneling current of ∼1 nA, and simultaneously the voltage of the electrode was probed using a voltmeter, which gave ∼1 mV.
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