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Applied Physics Letters

Volumn 71, Issue 1, 1997, Pages 137-139

Enhanced Jc and improved grain-boundary properties in Ag-doped YBa2Cu3O7-δ films

(5) Selvam, P a Seibt, E W b Kumar, D c Pinto, R c Apte, P R c

a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY (India)

b KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

c TATA INSTITUTE OF FUNDAMENTAL RESEARCH (India)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DOPING (ADDITIVES); ELECTRIC RESISTANCE; ELECTRON TRANSPORT PROPERTIES; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; LASER ABLATION; SILVER; STOICHIOMETRY; SURFACE PROPERTIES;

CHEVREL PHASE SUPERCONDUCTORS; HIGH RESOLUTION AUGER ELECTRON SPECTROSCOPY; TRANSPORT MEASUREMENT; YTTRIUM BARIUM CUPRATES;

SUPERCONDUCTING FILMS;

EID: 0031558217 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.119452 Document Type: Article

Times cited : (18)

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