메뉴 건너뛰기




Volumn 71, Issue 1, 1997, Pages 131-133

Unshielded use of thin-film Nb dc superconducting quantum interference devices and integrated asymmetric gradiometers for nondestructive evaluation

Author keywords

[No Author keywords available]

Indexed keywords

EDDY CURRENT TESTING; MAGNETIC SHIELDING; MAGNETIC VARIABLES MEASUREMENT; MAGNETOMETERS; NIOBIUM; NONDESTRUCTIVE EXAMINATION; NUMERICAL METHODS; THIN FILMS;

EID: 0031558168     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119450     Document Type: Article
Times cited : (3)

References (13)
  • 1
    • 0003912041 scopus 로고
    • The American Society for Nondestructive Testing, Columbux, OH
    • Nondestructive Testing Handbook, 2nd ed., edited by R. C. McMaster, P. McIntire and M. L. Mester (The American Society for Nondestructive Testing, Columbux, OH, 1986): See, in particular. Electromagnetic testing: Eddy current, Flux Leakage, and Microwave Nondestructive Testing, ibid. Vol. 4.
    • (1986) Nondestructive Testing Handbook, 2nd Ed.
    • McMaster, R.C.1    McIntire, P.2    Mester, M.L.3
  • 2
    • 85033160281 scopus 로고    scopus 로고
    • Electromagnetic testing: Eddy current, Flux Leakage, and Microwave Nondestructive Testing
    • Nondestructive Testing Handbook, 2nd ed., edited by R. C. McMaster, P. McIntire and M. L. Mester (The American Society for Nondestructive Testing, Columbux, OH, 1986): See, in particular. Electromagnetic testing: Eddy current, Flux Leakage, and Microwave Nondestructive Testing, ibid. Vol. 4.
    • Nondestructive Testing Handbook, 2nd Ed. , vol.4
  • 3
    • 5544276013 scopus 로고
    • T. E. Dixon, M. G. Silk, and D. J. MacKeith, INSIGHT 36, 256 (1994); M. G. Silk, T. E. Dixon, and D. J. MacKeith, ibid. 36, 342 (1994).
    • (1994) INSIGHT , vol.36 , pp. 256
    • Dixon, T.E.1    Silk, M.G.2    MacKeith, D.J.3
  • 4
    • 5544316224 scopus 로고
    • T. E. Dixon, M. G. Silk, and D. J. MacKeith, INSIGHT 36, 256 (1994); M. G. Silk, T. E. Dixon, and D. J. MacKeith, ibid. 36, 342 (1994).
    • (1994) INSIGHT , vol.36 , pp. 342
    • Silk, M.G.1    Dixon, T.E.2    MacKeith, D.J.3
  • 11
    • 85033163329 scopus 로고    scopus 로고
    • Cryogenic Electronic Systems Corporation, Springfield, MA; model BA-4
    • Cryogenic Electronic Systems Corporation, Springfield, MA; model BA-4.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.