Structure determination of Si(100)(2 × 1)/NH2 using scanned-energy mode photoelectron diffraction

Journal of Physics Condensed Matter

Volumn 9, Issue 40, 1997, Pages 8419-8432

  Franco, N ^a   Avila, J ^a   Davila, M E ^a   Asensio, M C ^a   Woodruff, D P ^b   Schaff, O ^c   Fernandez, V ^c   Schindler, K M ^c   Bradshaw, A M ^c  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b UNIVERSITY OF WARWICK   (United Kingdom)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC PHYSICS; CHEMICAL BONDS; NITROGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING SILICON;

SCANNED ENERGY MODE PHOTOELECTRON DIFFRACTION;

SURFACE STRUCTURE;

EID: 0031556328     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/9/40/009     Document Type: Article

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