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Volumn 101, Issue 6, 1997, Pages 944-948

Rigidities of cationic surfactant films in microemulsions

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELASTIC MODULI; ELASTICITY; ELECTROSTATICS; FREE ENERGY; LIGHT SCATTERING; MICROEMULSIONS; NEUTRON SCATTERING; SURFACE ACTIVE AGENTS;

EID: 0031555698     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp962048y     Document Type: Article
Times cited : (23)

References (22)
  • 15
    • 36549103866 scopus 로고
    • Szleifer, I.: Kramer, D.; Ben-Shaul, A.; Gelbart, W. M.; Safran, S. A. J. Chem. Phys. 1990, 92, 6800. Szleifer, I.; Ben-Shaul, A.; Gelbart, W. M. J. Phys. Chem. 1990, 94, 5018. Szleifer, I.; Kramer, D.; Ben-Shaul, A.; Gelbart, W. M.; Roux, D. Phys. Rev. Lett. 1988, 60, 1966.
    • (1990) J. Chem. Phys. , vol.92 , pp. 6800
    • Szleifer, I.1    Kramer, D.2    Ben-Shaul, A.3    Gelbart, W.M.4    Safran, S.A.5
  • 16
    • 5844230584 scopus 로고
    • Szleifer, I.: Kramer, D.; Ben-Shaul, A.; Gelbart, W. M.; Safran, S. A. J. Chem. Phys. 1990, 92, 6800. Szleifer, I.; Ben-Shaul, A.; Gelbart, W. M. J. Phys. Chem. 1990, 94, 5018. Szleifer, I.; Kramer, D.; Ben-Shaul, A.; Gelbart, W. M.; Roux, D. Phys. Rev. Lett. 1988, 60, 1966.
    • (1990) J. Phys. Chem. , vol.94 , pp. 5018
    • Szleifer, I.1    Ben-Shaul, A.2    Gelbart, W.M.3
  • 17
    • 35949011154 scopus 로고
    • Szleifer, I.: Kramer, D.; Ben-Shaul, A.; Gelbart, W. M.; Safran, S. A. J. Chem. Phys. 1990, 92, 6800. Szleifer, I.; Ben-Shaul, A.; Gelbart, W. M. J. Phys. Chem. 1990, 94, 5018. Szleifer, I.; Kramer, D.; Ben-Shaul, A.; Gelbart, W. M.; Roux, D. Phys. Rev. Lett. 1988, 60, 1966.
    • (1988) Phys. Rev. Lett. , vol.60 , pp. 1966
    • Szleifer, I.1    Kramer, D.2    Ben-Shaul, A.3    Gelbart, W.M.4    Roux, D.5
  • 19
  • 22
    • 85085781484 scopus 로고    scopus 로고
    • note
    • BT using the approaches of Mitchell and Ninham, and Lekkerkerker, respectively.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.